The use of XRF analysis in archaeological science is well documented the last 50 years. It is one of the most widely used techniques mainly because of the profound advantages it has (non-destructive, fast, low cost, applied on various inorganic materials etc.). The last decade new state of the art portable XRF facilities have been developed giving the opportunity to the qualified researcher to do analyses in situ either in the field or in museum collections.
In the present project a portable (hand held) XRF facility was used to analyse glass objects of museum collections. The facility used is a HH-XRF, Tracer III-SD, Bruker. The instrument was set at 15KeV, 24μA, without a filter, under vacuum to detect light elements and at 40KeV, 12μA, with an Al-Ti filter for the detection of trace elements. A custom made calibration curve was used for the detection of major, minor and trace elements (Na-Cu).